METHOD OF MITIGATING THE EFFECTS OF A DEFECTIVE ELECTROMECHANICAL PIXEL

摘要

Methods are disclosed by which the effects of a defective electromechanical pixel 20 having a beam 30 and a hinge 32,34 are mitigated. These methods may damage the hinge 32,34 or the beam 30 and comprise the step of applying a voltage sufficient to damage the hinge 32,34 or beam 30 of said electromechanical pixel 20 by mechanical overstress, thermal overstress, electrochemical reaction, or thermally induced chemical reaction. Other methods are also disclosed.