发明名称 In-system testing of an oscillator
摘要 Testing an oscillator and other electronic devices on a circuit board. One method of the present invention comprises powering the oscillator. Providing test instructions to a microprocessor on the circuit board to place the microprocessor in a test mode. Receiving a clock signal from the oscillator at a multiplexer in a field programmable gate array. Receiving operating instructions at the multiplexer from the microprocessor. Multiplexing the clock signal to an external access port with the multiplexer in response to the operating instructions and measuring the frequency of the clock signal at the external access port.
申请公布号 US2004019449(A1) 申请公布日期 2004.01.29
申请号 US20020201512 申请日期 2002.07.23
申请人 ADC DSL SYSTEMS, INC. 发明人 ESPINOZA JUAN A.;GIDDENS L. GRANT;TOLLERSON CLARK
分类号 G01R23/00;(IPC1-7):G06F19/00 主分类号 G01R23/00
代理机构 代理人
主权项
地址