发明名称 BLOCK SELECTION CIRCUIT OF FLASH MEMORY DEVICE
摘要 PURPOSE: A block selection circuit of a flash memory device is provided to select and process a failed block even after being packaged. CONSTITUTION: A selection part(21) includes a programmable and erasable flash memory cell by a voltage condition, and outputs a block selection signal according to an address signal and a selection signal and a state of the flash memory cell. A high voltage pumping part(22) outputs a signal maintaining a high voltage according to the above block selection signal and a clock signal. And a switching part(23) applies a bias to a gate select line and a word line and source select line of the flash memory cell according to an output signal of the above high voltage pumping part.
申请公布号 KR20040008023(A) 申请公布日期 2004.01.28
申请号 KR20020041315 申请日期 2002.07.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, JONG BAE
分类号 G11C16/06;G11C8/12;G11C11/34;G11C16/02;G11C16/08;G11C16/12;G11C29/00;(IPC1-7):G11C16/12 主分类号 G11C16/06
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