| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test facilitation circuit settled without proportioning an increase in the number of pins of a tester 90 with the number K of a DUT side output appropriable terminals even in the case that the number of the same measurement L is increased, and to provide the tester. <P>SOLUTION: The pins corresponding to the output appropriable terminals of DUT1 (10) and output appropriable terminals of DUT2 (20) in the tester (30) side can be shared like pins of a driver 33 or 36 by constituting a test device (test facilitation circuits 40 and 50, and the tester 30 or the like) of the test facilitation circuit 40 or the like and outputting expected value data from a tester 30 side. Even in the case that the number of DUTs is three or more, the pins corresponding to the output appropriable terminals can be shared like the pins of the driver 33 or 36. Thus, even in the case that the number of the same measurement L is increased, an increase in the number of the pins of the tester 30 can be settled without being proportioned with the number K of the DUT side output appropriable terminals. <P>COPYRIGHT: (C)2004,JPO |
