发明名称 |
NEW ESTER COMPOUND, POLYMER COMPOUND, RESIST MATERIAL AND PATTERN-FORMING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an ester compound, a polymer compound and a resist material responding to a high energy beam, excellent in sensitivity in a specific wavelength, improved in transparency and adhesiveness of a resist and permeability of the resist into a developing solution by using a copolymer of a compound containing a sulfonate or a sulfone as a base resin and having excellent plasma etching resistance. <P>SOLUTION: The sulfonate compound is represented by formula (1) (wherein R<SP>1</SP>to R<SP>3</SP>are each H, F or an alkyl group or a fluorinated alkyl group; R<SP>4</SP>is a single bond or an alkylene group or a fluorinated alkylene group; and R<SP>5</SP>is a fluorinated alkyl group). <P>COPYRIGHT: (C)2004,JPO |
申请公布号 |
JP2004002725(A) |
申请公布日期 |
2004.01.08 |
申请号 |
JP20030075440 |
申请日期 |
2003.03.19 |
申请人 |
SHIN ETSU CHEM CO LTD;MATSUSHITA ELECTRIC IND CO LTD;CENTRAL GLASS CO LTD |
发明人 |
HARADA YUJI;HATAKEYAMA JUN;KAWAI YOSHIO;SASAKO MASARU;ENDO MASATAKA;KISHIMURA SHINJI;MAEDA KAZUHIKO;OTANI MITSUTAKA;KOMORIYA HARUHIKO |
分类号 |
G03F7/039;C07C309/67;C07C317/12;C08F28/02;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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