发明名称 Accelerated fatigue testing
摘要 A memory such as a FeRAM implements accelerated fatigue operations that simultaneously change the storage state of large numbers of memory cells and can be rapidly repeated. In one embodiment, the FeRAM includes multiple segments with plate lines in each segment being isolated from plate lines in other segments. A first fatigue operation uses standard read/write decoding for word lines but simultaneously activates all segments. A second fatigue operation activates all segments and all plate lines and exercises one row of memory cells in each plate line group. A third fatigue operation is similar to the second but cycles through rows in the plate line groups so that a number of repetitions of the third fatigue operation equally fatigue every FeRAM cell.
申请公布号 US2004004854(A1) 申请公布日期 2004.01.08
申请号 US20020190102 申请日期 2002.07.02
申请人 RICKES JUERGEN T.;MCADAMS HUGH P.;GRACE JAMES W.;FONG JOHN Y.;LANHAM RALPH H. 发明人 RICKES JUERGEN T.;MCADAMS HUGH P.;GRACE JAMES W.;FONG JOHN Y.;LANHAM RALPH H.
分类号 G11C11/22;G11C29/50;G11C29/56;(IPC1-7):F21S8/00 主分类号 G11C11/22
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