发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to be capable of preventing the reduction of capacitance and improving leakage current. CONSTITUTION: A lower electrode(21) made of polysilicon is formed on a semiconductor substrate(20). The lower electrode(21) is then cleaned using HF and NH4OH. Nitridation processing of the lower electrode is performed by using NH3 annealing. A nitride layer(22) is deposited on the lower electrode. A dielectric film(23) and an upper electrode(24) are then sequentially formed on the nitride layer(22).
申请公布号 KR20040000643(A) 申请公布日期 2004.01.07
申请号 KR20020035155 申请日期 2002.06.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, GYEONG MIN;OH, HUN JEONG;PARK, JONG BEOM
分类号 H01L27/04;H01L21/02;H01L21/314;H01L21/316;H01L21/318;(IPC1-7):H01L27/04 主分类号 H01L27/04
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