发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to be capable of preventing the reduction of capacitance and improving leakage current. CONSTITUTION: A lower electrode(21) made of polysilicon is formed on a semiconductor substrate(20). The lower electrode(21) is then cleaned using HF and NH4OH. Nitridation processing of the lower electrode is performed by using NH3 annealing. A nitride layer(22) is deposited on the lower electrode. A dielectric film(23) and an upper electrode(24) are then sequentially formed on the nitride layer(22).
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申请公布号 |
KR20040000643(A) |
申请公布日期 |
2004.01.07 |
申请号 |
KR20020035155 |
申请日期 |
2002.06.22 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GYEONG MIN;OH, HUN JEONG;PARK, JONG BEOM |
分类号 |
H01L27/04;H01L21/02;H01L21/314;H01L21/316;H01L21/318;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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