发明名称 |
LSI communication device with automatic test capability |
摘要 |
A communication LSI device includes a state machine section and a test control section. The state machine section carries out a configuration operation in an idle state in response to a first reset signal. The state machine section changes to the idle state after completion of the configuration operation. The state machine section outputs a flag signal after a predetermined time since the state machine section changes to the idle state. The test control section outputs one the first reset signal to the state machine section in a test mode in response to the flag signal or a second reset signal externally supplied.
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申请公布号 |
US6675332(B1) |
申请公布日期 |
2004.01.06 |
申请号 |
US20000715170 |
申请日期 |
2000.11.20 |
申请人 |
NEC CORPORATION |
发明人 |
SUZUKI KOICHIRO;CHIBA KATSUHARU |
分类号 |
G06F11/22;G01R31/28;G06F11/24;(IPC1-7):G01R31/28 |
主分类号 |
G06F11/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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