发明名称 |
Method and apparatus for exercising external memory with a memory built-in self-test |
摘要 |
A method and arrangement for testing different types of external memories that can be coupled to a network interface controller. The network interface controller interprets the results of the memory test differently in accordance with the memory type. A fail state indicator is used by test controller to indicate the proper offset to add or subtract to a test address to calculate the actual failing memory location.
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申请公布号 |
US6675335(B1) |
申请公布日期 |
2004.01.06 |
申请号 |
US20000517517 |
申请日期 |
2000.03.02 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
CHIANG SIE BOO;KHOU BENG CHEW;WONG JACQUES |
分类号 |
G01R31/28;G06F11/22;G06F12/16;G11C29/48;G11C29/56;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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