Test bench generator for integrated circuits, particularly memories

摘要

A computer based test bench generator (1) for verifying integrated circuits specified by models in a Hardware Description Language comprises a repository (10) storing a general set of self-checking tests applicable to the integrated circuits, means for entering behaviour data (21) of an integrated circuit model (20), means for entering configuration data (22) of the integrated circuit model and means for automatically generating test benches (30) in said Hardware Description Language, which means are configured to make a selection and setup of suitable tests from the repository according to the specified integrated circuit model, configuration and behaviour data.