发明名称 |
Method and apparatus for observing element distribution |
摘要 |
There are provided an element distribution observing method and an element distribution observing apparatus under utilization of core-loss electrons capable of restricting artifact caused by either a thickness or density of a specimen, or an occurrence of the artifact caused by a diffraction contrast. Electron beam intensities in a total three different energy-loss areas of two energy-loss areas not containing any core-loss electrons and one energy-loss area are calculated to attain an element distribution on the basis of the corresponding three energy-loss areas and an electron beam intensity.
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申请公布号 |
US2004000641(A1) |
申请公布日期 |
2004.01.01 |
申请号 |
US20030435050 |
申请日期 |
2003.05.12 |
申请人 |
TANIGUCHI YOSHIFUMI;KAJI KAZUTOSHI;UEKI YASUMITSU;ISAKOZAWA SHIGETO |
发明人 |
TANIGUCHI YOSHIFUMI;KAJI KAZUTOSHI;UEKI YASUMITSU;ISAKOZAWA SHIGETO |
分类号 |
G01N23/08;G01N23/02;G01N23/04;H01J37/05;H01J37/26;H01J37/28;(IPC1-7):G01N23/00 |
主分类号 |
G01N23/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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