发明名称 Method and apparatus for observing element distribution
摘要 There are provided an element distribution observing method and an element distribution observing apparatus under utilization of core-loss electrons capable of restricting artifact caused by either a thickness or density of a specimen, or an occurrence of the artifact caused by a diffraction contrast. Electron beam intensities in a total three different energy-loss areas of two energy-loss areas not containing any core-loss electrons and one energy-loss area are calculated to attain an element distribution on the basis of the corresponding three energy-loss areas and an electron beam intensity.
申请公布号 US2004000641(A1) 申请公布日期 2004.01.01
申请号 US20030435050 申请日期 2003.05.12
申请人 TANIGUCHI YOSHIFUMI;KAJI KAZUTOSHI;UEKI YASUMITSU;ISAKOZAWA SHIGETO 发明人 TANIGUCHI YOSHIFUMI;KAJI KAZUTOSHI;UEKI YASUMITSU;ISAKOZAWA SHIGETO
分类号 G01N23/08;G01N23/02;G01N23/04;H01J37/05;H01J37/26;H01J37/28;(IPC1-7):G01N23/00 主分类号 G01N23/08
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