发明名称 VERTICAL NROM
摘要 <p>Structures and methods for vertical memory cell. The vertical memory cell includes a vertical metal oxide semiconductor field effect transistor (MOSFET) (301) extending outwardly from a substrate (300). The MOSFET (301) has a first source/drain region (302), a second source/drain region (306), a channel region (305) between the first and the second source/drain regions, and a gate (309) separated from the channel region (305) by a gate insulator (307). A first transmission line is coupled to the first source/drain region (302). A second transmission line is coupled to the second source/drain region (306). The MOSFET (301) is adapted to be programmed to have a charge trapped in at least one of a first storage region (340) and a second storage region (350) in the gate insulator (307) and operated with either the first source/drain region or the second source/drain region (306) serving as the source region.</p>
申请公布号 WO2004001856(A1) 申请公布日期 2003.12.31
申请号 WO2003US14497 申请日期 2003.05.08
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES, LEONARD
分类号 G11C16/02;G11C16/04;H01L21/28;H01L21/336;H01L21/338;H01L21/8238;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/105;H01L27/108;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/792 主分类号 G11C16/02
代理机构 代理人
主权项
地址