DIAGNOSTIC ADAPTOR WITH THREADLESS DOCKING FIXTURE

摘要

A threadless docking fixture for removably mounting a test device in functional electrical engagement with a test head on a parametric semiconductor wafer testing system. The threadless docking fixture comprises a housing in which is mounted the test device. The housing is fitted with a pivoting lock handle which terminates in a pair of lock plates rotatably attached to opposite sides of the housing. An arcuate lock flange on each lock plate removably engages a lock rod which extends from a corresponding one of a pair of anchor plates which are mounted on the test head of the wafer testing system. Accordingly, each lock flange engages the corresponding lock rod and the test device is mounted in functional electrical engagement with the test head as the handle is pivoted from an unlock to a lock position.