发明名称 Method for manufacturing semiconductor device
摘要 A method is provided for manufacturing a semiconductor device that can reduce the number of steps in manufacturing a triple-well that includes multiple ion implantation steps and heat treatment steps. The method comprises the steps of: (a) forming a first mask layer having a first opening section on a semiconductor substrate; (b) forming a first dielectric layer on an exposed surface of the semiconductor substrate in the first opening section; (c) forming an impurity layer by introducing a first impurity of a second conductivity type in the semiconductor substrate through the first dielectric layer; (d) conducting a heat treatment to form a first well, and a second dielectric layer on the exposed surface of the semiconductor substrate in the first opening section; (e) forming a second mask layer having a second opening section on the first mask layer; and (f) forming a second well within the first well by introducing a second impurity of the first conductivity type in the semiconductor substrate through the second dielectric layer.
申请公布号 US2003228731(A1) 申请公布日期 2003.12.11
申请号 US20030382357 申请日期 2003.03.05
申请人 HAYASHI MASAHIRO 发明人 HAYASHI MASAHIRO
分类号 H01L21/265;H01L21/266;H01L21/316;H01L21/324;H01L21/8234;(IPC1-7):H01L21/823;H01L21/425 主分类号 H01L21/265
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