发明名称 Well bias control circuit
摘要 Disclosed is a semiconductor integrated circuit device having a control mechanism 11 for compensating not only circuit operational speed but also variations in leakage current, which includes: a main circuit 10 constructed by a CMOS; a delay monitor 21 for simulating a critical path of the main circuit 10 constructed by a CMOS and monitoring a delay of the path; a PN Vt balance compensation circuit 23 for detecting a threshold voltage difference between a PMOS transistor and an NMOS transistor; and a well bias generating circuit 25 for receiving outputs of the delay monitor 21 and the PN Vt balance compensation circuit 23 and applying a well bias to the delay monitor 21 and the main circuit 10 so as to compensate the operation speed of the delay monitor 21 to a desired speed and reduce a threshold voltage difference between the PMOS and NMOS transistors.
申请公布号 US6653890(B2) 申请公布日期 2003.11.25
申请号 US20020284207 申请日期 2002.10.31
申请人 RENESAS TECHNOLOGY CORPORATION 发明人 ONO GOICHI;MIYAZAKI MASAYUKI;ISHIBASHI KOICHIRO
分类号 H01L21/822;G11C11/40;H01L21/8238;H01L27/04;H01L27/092;H03K17/30;H03K19/003;(IPC1-7):G05F1/46 主分类号 H01L21/822
代理机构 代理人
主权项
地址