发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR WAFER AMD WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor wafer which can manufacture a wafer free from a ring type drop in an outer peripheral part of a wafer, when a wafer subjected to alkali etching is polished, and to provide the wafer free from the ring type drop in the outer peripheral part of the wafer. <P>SOLUTION: The manufacturing method is provided with: a partly polishing and chamber mirror finishing process of rear part wherein mirror finishing is performed as far as a part of in-plane surface of rear surface to the boundary with the chamber part of the material wafer; and a front surface polishing process wherein a rear of the wafer where partly polishing and chamber mirror finishing are performed is supported, and the front surface of the wafer is subjected to mirror finishing. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2003324081(A) 申请公布日期 2003.11.14
申请号 JP20020128550 申请日期 2002.04.30
申请人 SHIN ETSU HANDOTAI CO LTD;NAGANO DENSHI KOGYO KK 发明人 KIDA TAKAHIRO;MIYAZAKI SEIICHI;NISHIMURA KAZUHIKO;HAYASHI NOBUYUKI;ARAI KATSUNORI
分类号 B24B9/00;B24B9/06;B24B37/04;H01L21/302;H01L21/304;H01L21/306 主分类号 B24B9/00
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