发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR WAFER AMD WAFER |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor wafer which can manufacture a wafer free from a ring type drop in an outer peripheral part of a wafer, when a wafer subjected to alkali etching is polished, and to provide the wafer free from the ring type drop in the outer peripheral part of the wafer. <P>SOLUTION: The manufacturing method is provided with: a partly polishing and chamber mirror finishing process of rear part wherein mirror finishing is performed as far as a part of in-plane surface of rear surface to the boundary with the chamber part of the material wafer; and a front surface polishing process wherein a rear of the wafer where partly polishing and chamber mirror finishing are performed is supported, and the front surface of the wafer is subjected to mirror finishing. <P>COPYRIGHT: (C)2004,JPO |
申请公布号 |
JP2003324081(A) |
申请公布日期 |
2003.11.14 |
申请号 |
JP20020128550 |
申请日期 |
2002.04.30 |
申请人 |
SHIN ETSU HANDOTAI CO LTD;NAGANO DENSHI KOGYO KK |
发明人 |
KIDA TAKAHIRO;MIYAZAKI SEIICHI;NISHIMURA KAZUHIKO;HAYASHI NOBUYUKI;ARAI KATSUNORI |
分类号 |
B24B9/00;B24B9/06;B24B37/04;H01L21/302;H01L21/304;H01L21/306 |
主分类号 |
B24B9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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