发明名称 Programmable memory devices with latching buffer circuit and methods for operating the same
摘要 Programmable memory devices include a memory cell having an associated bit line. A buffer circuit couples the bit line to a data line. The buffer circuit has a sense node coupled to the bit line and includes a latch circuit having a latch node coupled to the data line. A control circuit resets the latch node between a program operation of the memory cell and its corresponding program-verify operation. The memory devices may be NAND-type flash memory devices and the memory cell may be one of a string of memory cells connected in series between the bit line and a common source line. A transistor may couple the data line to the latch node and a transistor may couple the latch node to the sense node. Methods of operating the same are also provided.
申请公布号 US2003210576(A1) 申请公布日期 2003.11.13
申请号 US20030403739 申请日期 2003.03.31
申请人 HWANG SANG-WON;LEE SUNG-SOO 发明人 HWANG SANG-WON;LEE SUNG-SOO
分类号 G11C16/02;G11C7/06;G11C16/24;(IPC1-7):G11C7/00;G11C5/00;G11C16/06 主分类号 G11C16/02
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