发明名称 Thermal flux processing by scanning
摘要 The thermal flux processing device includes a continuous wave electromagnetic radiation source, a stage, optics, and a translation mechanism. The continuous wave electromagnetic radiation source is preferably a diode/s. The stage is configured to receive a semiconductor substrate thereon. The optics are preferably disposed between the continuous wave electromagnetic radiation source and the stage. Also, the optics are configured to focus continuous wave electromagnetic radiation from the continuous wave electromagnetic radiation source into a line of continuous wave electromagnetic radiation on an upper surface of the semiconductor substrate. A length of the line of continuous wave electromagnetic radiation extends across an entire width of the semiconductor substrate. The translation mechanism is configured to translate the stage and the line of continuous wave electromagnetic radiation relative to one another, and preferably includes a chuck for securely grasping the substrate. A method for thermally processing a semiconductor substrate is also provided.
申请公布号 US2003196995(A1) 申请公布日期 2003.10.23
申请号 US20020126419 申请日期 2002.04.18
申请人 JENNINGS DEAN 发明人 JENNINGS DEAN
分类号 B23K26/03;B23K26/06;B23K26/08;B23K26/12;B23K26/34;C23C8/00;C23C8/10;C23C8/22;C23C16/04;C23C16/48;H01L21/20;(IPC1-7):B23K26/06 主分类号 B23K26/03
代理机构 代理人
主权项
地址