| 摘要 |
An insert for an electric devices testing apparatus, including a latch portion for moving between a first position for holding over an upper surface of electric devices under test held on an insert in a second position receding from the upper surface of the electric devices under test, and a latch arm portion for rotatably supporting the latch portion on the insert body, wherein a tip of the latch portion and a rotation center of the latch arm portion are arranged at the first position on an approximately vertical line, the latch portion and the rotation center of the latch arm portion being offset in a plan view of the insert.
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