发明名称 MANUFACTURING METHOD AND APPARATUS TO AVOID PROTOTYPE-HOLD IN ASIC/SOC MANUFACTURING
摘要 A manufacturing process for LSIs uses an event tester to avoid prototype hold. The LSI manufacturing method includes the steps of: designing an LSI under an EDA (electronic design automation) environment to produce design data of a designed LSI, performing logic simulation on a device model of the LSI design in the EDA environment with use of a testbench and producing a test vector file of an event format as a result of the logic simulation, verifying simulation data files with use of the design data and the testbench by operating an event tester simulator, producing a prototype LSI through a fabrication provider by using the design data, and testing the prototype LSI by an event tester by using the test vector file and the simulation data files and feedbacking test results to the EDA environment or the fabrication provider.
申请公布号 WO03085706(A1) 申请公布日期 2003.10.16
申请号 WO2003JP04629 申请日期 2003.04.11
申请人 ADVANTEST CORPORATION 发明人 RAJSUMAN, ROCHIT;YAMOTO, HIROAKI
分类号 H01L21/822;G01R31/28;G01R31/317;G01R31/3183;G01R31/319;G06F17/50;G06F19/00;H01L21/02;H01L21/82;H01L27/04;H01L27/118;(IPC1-7):H01L21/02 主分类号 H01L21/822
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