发明名称 |
DDR/SDR COMMON REPAIR CIRCUIT |
摘要 |
PURPOSE: A DDR/SDR common repair circuit is provided which is used in both a single data rate(SDR) mode and a double data rate(DDR) mode. CONSTITUTION: The first fuse part(210) comprises a plurality of fuse circuits(211,212), and each fuse circuit generates a repair address signal. The second fuse part(220) comprises a plurality of fuse circuits(221-227) and each fuse circuit generates a repair address signal. The first comparison part(230) comprises a plurality of comparators(231-234), and each comparator performs a comparison operation by the repair address signal inputted from each fuse circuit and the first external address even signal inputted from the external. The second comparison part(240) comprises a plurality of comparators(241-247), and each comparator performs a comparison operation by the repair address signal inputted from each fuse circuit and an external address signal inputted from the external. And a repair signal generation part(250) receives a plurality of signals being output from the first and the second comparison part, and generates a plurality of repair signals by the plurality of signals.
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申请公布号 |
KR20030078336(A) |
申请公布日期 |
2003.10.08 |
申请号 |
KR20020017318 |
申请日期 |
2002.03.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, U YEONG;CHOI, BYEONG JIN;NAM, YEONG JUN |
分类号 |
G11C29/00;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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