发明名称 DDR/SDR COMMON REPAIR CIRCUIT
摘要 PURPOSE: A DDR/SDR common repair circuit is provided which is used in both a single data rate(SDR) mode and a double data rate(DDR) mode. CONSTITUTION: The first fuse part(210) comprises a plurality of fuse circuits(211,212), and each fuse circuit generates a repair address signal. The second fuse part(220) comprises a plurality of fuse circuits(221-227) and each fuse circuit generates a repair address signal. The first comparison part(230) comprises a plurality of comparators(231-234), and each comparator performs a comparison operation by the repair address signal inputted from each fuse circuit and the first external address even signal inputted from the external. The second comparison part(240) comprises a plurality of comparators(241-247), and each comparator performs a comparison operation by the repair address signal inputted from each fuse circuit and an external address signal inputted from the external. And a repair signal generation part(250) receives a plurality of signals being output from the first and the second comparison part, and generates a plurality of repair signals by the plurality of signals.
申请公布号 KR20030078336(A) 申请公布日期 2003.10.08
申请号 KR20020017318 申请日期 2002.03.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, U YEONG;CHOI, BYEONG JIN;NAM, YEONG JUN
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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