发明名称 Cart for electric or electronic devices having a testing function
摘要 The present invention relates to a cart for electric or electronic devices having a testing function, and more particularly to the cart that can transport electric or electronic devices and test the function of the loaded devices. The cart includes a support frame, a carrying means mounted on the bottom of the support frame, a loading member arranged in the support frame, and input/output devices for inputting the test conditions and outputting the test results. According to the present invention, the loading and testing of electric or electronic devices can be performed simultaneously, resulting in a simplified testing process and significantly reduced testing time.
申请公布号 US2003184035(A1) 申请公布日期 2003.10.02
申请号 US20030404350 申请日期 2003.03.31
申请人 YU HYO-SUN 发明人 YU HYO-SUN
分类号 B62B3/00;(IPC1-7):B62B3/00 主分类号 B62B3/00
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