| 摘要 |
There is provided a slit lamp microscope in which a dedicated image pickup device is installed to an observation system to enhance the image pickup function for an eye to be examined, operability of the observation system by an examiner is excellent, and moreover the cables are not exposed, thereby achieving a superior outward appearance. The slit lamp microscope includes an illumination system for illuminating an eye to be examined, an observation system for observing the eye to be examined, a support arm for supporting the observation system on the upper end side thereof, a base for rotatably on a protruding shaft barrel portion thereof the illumination system and the lower end side of the support arm supporting the observation system, a pedestal for supporting the base, a chin rest stand for securing the eye to be examined with a state in which the eye is opposed to the observation system, and a table on which the pedestal is installed and to which the chin rest stand is attached. An image pickup device composed of an image pickup unit for taking an observation image of the eye to be examined from the observation system and an operation processing unit for conducting image pickup operation and image signal processing, which has an operation portion and is integrally formed with the image pickup unit, is attached to the support arm in a position near the observation system, and an operation pressing button group is provided in a direction orthogonal to an end of operation processing means along a rotation under line of the support arm.
|
