发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To reduce the number of steps in a manufacture process, to prevent the defect of a contact between a substrate and a lower electrode (first electrode) and a cylinder fall and to improve yield by manufacturing a cylindrical capacitor having a support structure without using an adhesion enhanced layer. <P>SOLUTION: The method of manufacturing the semiconductor device has a step for forming a support film having a hole, a step for forming the cylindrical platinum first electrode in the hole of the support film, a step for forming a reaction layer from chemical reaction on the interface of the first electrode and the support film, a step for forming an insulating film on the first electrode, and a step for forming a conductive second electrode on the insulating film. <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003273247(A) 申请公布日期 2003.09.26
申请号 JP20020077222 申请日期 2002.03.19
申请人 FUJITSU LTD 发明人 TSUNODA KOJI;SATO AKIRA;SUZUKI HISAYA
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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