发明名称 Vibration noise mitigation in an interferometric system
摘要 In the measurements of optical characteristics, such as measurements of group delay using an interferometric system, vibration noise can be at least partially offset by providing corrections (63) on the basis of detecting light patterns that are indicative of the vibration noise. In each embodiment, light beams propagating through first and second paths (50 and 52; 80 and 82; 112 and 114; and 134 and 136) are combined to form an interference signal, which is analyzed to provide the basis for the adjustments. <IMAGE>
申请公布号 EP1347265(A2) 申请公布日期 2003.09.24
申请号 EP20020023152 申请日期 2002.10.15
申请人 AGILENT TECHNOLOGIES, INC. 发明人 BANEY, DOUGLAS M.;VAN WIGGEREN, GREGORY D.;MOTAMEDI, ALI
分类号 G01B9/02;G01J9/02;(IPC1-7):G01B9/02 主分类号 G01B9/02
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