发明名称 LENS INSPECTING APPARATUS AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a lens inspecting apparatus and a lens inspecting method capable of appropriately evaluating optical characteristics in relation to optical equipment. SOLUTION: The lens inspecting apparatus which makes image light including a specific test pattern incident on a lens 160 for inspecting the lens 160 used for optical equipment, and detects irradiation light from the lens 160 for inspection, is provided with a light source 410 for emitting reference luminous flux for inspection, an image light emission section 450 for generating the image light including a specific test pattern based on luminous flux that is emitted from the light source 410 for introducing to the lens 160, an image light detection section for detecting image light that is emitted from the lens 160, and a wavelength conversion section 42 for converting luminous flux that is emitted from the light source 410 to color light in a specific wavelength region. The wavelength conversion section 420 is provided with a plurality of filters where a transmission wavelength region is continuously set over an entire visible light region, and a filter-switching section for switching the plurality of filters. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003270093(A) 申请公布日期 2003.09.25
申请号 JP20020074469 申请日期 2002.03.18
申请人 SEIKO EPSON CORP 发明人 KITABAYASHI MASASHI
分类号 G01M11/02;(IPC1-7):G01M11/02 主分类号 G01M11/02
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