发明名称 INSPECTION APPARATUS, MEASURING INSTRUMENT, AND METHOD FOR MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To provide an inspection apparatus that can inspect an object for three-dimensional shape at a high speed. SOLUTION: This inspection apparatus 1 which inspects the object 9 for three-dimensional shape is provided with a stage 2 for holding the object 9, two slit light emitting sections 31 which respectively emit slit light rays toward the stage 2 from different directions, and a TDI line camera 32 which picks up the image of the object 9 put on the stage 2. This apparatus 1 is also provided with a stage driving section 21 which moves the stage 2. Since the image of the object 9 is picked up by synchronizing the image picking-up motion of the camera 32 with the object moving operation by means of the stage driving section 21, an image containing three-dimensional information can be acquired at a high speed. In addition, the object 9 can be inspected for three- dimensional shape at a high speed by comparing the acquired image with a reference image. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003262509(A) 申请公布日期 2003.09.19
申请号 JP20020063453 申请日期 2002.03.08
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 ONISHI HIROYUKI
分类号 G01B11/24;G01N21/956;H04N5/225;(IPC1-7):G01B11/24 主分类号 G01B11/24
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