| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an inspection apparatus for electronic component which facilitates a decrease in size and an improvement in an examining speed. <P>SOLUTION: The inspection apparatus for electronic component comprises a container disposing region for disposing only one row of a container for housing an electronic component and a heater for overheating the component along a predetermined direction, an examining region for disposing an examining unit and a component conveying unit for conveying the component. Thus, the component is conveyed via a component conveyor between the container disposing region, the heater and the examining region to electrically examine the component in an overheated state. Since the plurality of the containers and the heaters are disposed only in one row along the predetermined direction, the need for conveying the component in a direction different from the row direction is reduced. As a result, the apparatus is reduced in size, and improved in the examining speed due to the reduction in the distance of conveyance. <P>COPYRIGHT: (C)2003,JPO</p> |
