发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method, capable of forming a resistance element whose sheet resistance is high by using a simple method. <P>SOLUTION: When a first semiconductor layer and a second semiconductor layer, whose impurity concentration is high than that of the first semiconductor layer, are formed on a semi-insulating substrate and the resistance element is formed on the second semiconductor layer, an electrode of the resistance element is formed on the region of the second semiconductor layer in which region the resistance element is to be formed, and the region is electrically isolated. Impurity ions are implanted in this region whose surface is covered with the second semiconductor layer, and the resistance element is formed. After the impurity ions are implanted, a processing such as conventional thermal processing is not conducted. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003258106(A) 申请公布日期 2003.09.12
申请号 JP20020052891 申请日期 2002.02.28
申请人 NEW JAPAN RADIO CO LTD 发明人 WAKI EIJI;MIYAKOSHI KAORU
分类号 H01L27/04;H01L21/265;H01L21/822;(IPC1-7):H01L21/822 主分类号 H01L27/04
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