发明名称 SOFT X-RAY LITHOGRAPHIC SYSTEM
摘要 Conventional soft X-ray lithographic system employing proximity exposure method is advanced by rendering the system feasibility of reductive projection method which has been proved of its merit in photo-lithography and the present inventive imaging system comprises basically a soft X-ray source which is emissive like a point source, a spherically concaved reflector to converge the soft X-ray onto a Fresnel zone plate (FZP) wherein a mask pattern or an original to be copied is positioned between the reflector and the FZP so that the soft X-ray will transmit through the mask pattern to form a reduced image or copy thereof on a resist coated target substrate. Therefore, the present invention will be most advantageously applied to patterning jobs in IC industry.
申请公布号 WO8700644(A1) 申请公布日期 1987.01.29
申请号 WO1986JP00376 申请日期 1986.07.18
申请人 SHIMADZU CORPORATION 发明人 MAKABE, HIDEKI;IWAHASHI, KENJI
分类号 G03F7/20;G21K1/06;H01L21/027;(IPC1-7):G03F7/20 主分类号 G03F7/20
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