| 摘要 |
PROBLEM TO BE SOLVED: To determine I/O defects of a chip with test proves applied to two sides of the chip in the chip with pads provided on four sides. SOLUTION: A semiconductor storage unit has data pads which input/output data arranged on predetermined two sides, and control pads which input/output control data arranged on other two sides. The unit includes test circuits connected in series and connected to a corresponding data pads and has a register circuit. The register circuit holds and outputs inputted data based on a test signal. Storage elements store data and are connected to a corresponding test circuit. At the time of testing, the elements store the data from a predetermined data pad and transmitted to a predetermined test circuit. The register circuit reads the data in the corresponding storage element and outputs the data from the predetermined data pad via other register circuit. COPYRIGHT: (C)2003,JPO
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