CONTACT PROBE AND METHOD OF MANUFACTURING THE SAME

摘要

PROBLEM TO BE SOLVED: To reduce a capacitance provided at a contact probe and to enhance electrical characteristics in the contact probe and in a method of manufacturing the contact probe. SOLUTION: In the contact probe 10, a plurality of pattern interconnections 12 are formed on the surface of a film 11, and respective tip parts of the pattern interconnections are arranged in a tip part of the film so as to be used as contact pins 12a. The rear side of the film is provided with a metal layer 11b. The metal layer is constituted of a tip-part region 11c, extending at right angles to the plurality of pattern interconnections in the tip part of the film; a base- end-part region 11c arranged in a base end part of the film; and connection regions 11e extended in a thin belt shape up to the region 11d from the region 11c. COPYRIGHT: (C)2003,JPO