发明名称 |
METHOD AND APPARATUS FOR MEASURING WAVELENGTH |
摘要 |
PROBLEM TO BE SOLVED: To allow measurement at a very low cost and in a short time. SOLUTION: A wavelength measuring apparatus (30) measures oscillation wavelength of laser beam emitted from a laser diode (31). A photodiode (32) receives the laser beam emitted from the laser diode. An ammeter (33) measures a current value flowing the photodiode. A color filter (34) is retractably disposed between the laser diode and the photodiode. A processor (38) acquires a transmissivity of a color filter by comparing a first current value that flows the photodiode which is measured with the ammeter before the color filter is inserted with a second current value that flows the photodiode which is measured with the ammeter after the color filter is inserted. The oscillation wavelength of the laser beam is decided from the acquired transmissivity of the color filter. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003247894(A) |
申请公布日期 |
2003.09.05 |
申请号 |
JP20020048114 |
申请日期 |
2002.02.25 |
申请人 |
MITSUMI ELECTRIC CO LTD |
发明人 |
TAKEUCHI TOSHIO;SUGA KENJI |
分类号 |
G01J9/00;(IPC1-7):G01J9/00 |
主分类号 |
G01J9/00 |
代理机构 |
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主权项 |
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地址 |
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