发明名称 INSPECTION DEVICE AND INSPECTION METHOD FOR SLIT DIE COATING
摘要 PROBLEM TO BE SOLVED: To provide an inspection device that can ensure such a state of discharge in a slit die coating system as forms a coating film of a more even film thickness by inspecting a coating state in advance in a slit die system. SOLUTION: The inspection device for slit die coating, which inspects a discharge bead of a coating solution just after discharge from a slit die when the coating solution is forced out from a slit in the slit die and applied to a material to be coated, has a front observation part or a back observation part having an arrangement of an illuminator for illuminating the bead slantingly and an imaging camera for picking up an image by the illumination. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003247949(A) 申请公布日期 2003.09.05
申请号 JP20020047580 申请日期 2002.02.25
申请人 TOPPAN PRINTING CO LTD 发明人 YAMAGUCHI MIKIRO;KUBOYAMA SATOSHI
分类号 G01B11/24;B05C5/02;B05C11/00;B05D1/26;B05D3/00;G01N21/892;(IPC1-7):G01N21/892 主分类号 G01B11/24
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