发明名称 System and method for analyzing a surface by mapping sample points onto the surface and sampling the surface at the mapped points
摘要 A system and method for analyzing a surface. The system includes a computer including a CPU and a memory medium operable to store programs executable by the CPU to perform the method. The method may include: 1) receiving data describing an n-dimensional surface defined in a bounded n-dimensional space, where the surface is embedded in an m-dimensional real space via embedding function x( ), and where m>n; 2) determining a diffeomorphism f of the n-dimensional space; 3) computing the inverse transform f-1 of the diffeomorphism f; 4) selecting points, e.g., a Low Discrepancy Sequence, in the n-dimensional space; 5) mapping the points onto the surface using x(f-1), thereby generating mapped points on the surface; 6) sampling the surface using at least a subset of the mapped points to generate samples of the surface; and 7) analyzing the samples of the surface to determine characteristics of the surface.
申请公布号 US6615158(B2) 申请公布日期 2003.09.02
申请号 US20010891566 申请日期 2001.06.25
申请人 NATIONAL INSTRUMENTS CORPORATION 发明人 WENZEL LOTHAR;NAIR DINESH;RAJAGOPAL RAM
分类号 G06F17/18;G06T5/00;G06T7/00;(IPC1-7):G06F3/00 主分类号 G06F17/18
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