发明名称 A METHOD OF TESTING AND AN ELECTRONIC CIRCUIT COMPRISING A FLIPFLOP WITH A MASTER AND A SLAVE
摘要 A flipflop has master and slave interconnected through a buffer. The master has its inverters located outside the signal path from input to output, as the buffer provides the driving capability required for both IDDQ-testing and operational use. This configuration enables IDDQ-testing without further circuitry added to the flipflop and reduces propagation delay in the signal path.
申请公布号 EP0717851(B1) 申请公布日期 2003.08.27
申请号 EP19950921948 申请日期 1995.06.29
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 SACHDEV, MANOJ
分类号 G01R31/317;G01R31/28;G01R31/30;G01R31/3185;G06F11/267;H03K3/037 主分类号 G01R31/317
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