发明名称 |
A METHOD OF TESTING AND AN ELECTRONIC CIRCUIT COMPRISING A FLIPFLOP WITH A MASTER AND A SLAVE |
摘要 |
A flipflop has master and slave interconnected through a buffer. The master has its inverters located outside the signal path from input to output, as the buffer provides the driving capability required for both IDDQ-testing and operational use. This configuration enables IDDQ-testing without further circuitry added to the flipflop and reduces propagation delay in the signal path. |
申请公布号 |
EP0717851(B1) |
申请公布日期 |
2003.08.27 |
申请号 |
EP19950921948 |
申请日期 |
1995.06.29 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
SACHDEV, MANOJ |
分类号 |
G01R31/317;G01R31/28;G01R31/30;G01R31/3185;G06F11/267;H03K3/037 |
主分类号 |
G01R31/317 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|