发明名称 APPARATUS FOR MEASURING DENSITY OF SPECIFIC MATERIAL, APPARATUS FOR CHECKING DENSITY OF SPECIFIC MATERIAL BY USING THE SAME, AND METHOD FOR INSPECTING SATURATED STATE OF SPECIFIC MATERIAL
摘要 PURPOSE: An apparatus for measuring density of specific material, an apparatus for checking density of specific material by using the same, and a method for inspecting a saturated state of specific material are provided to precisely measure and check density of specific material contained in chemical medicine. CONSTITUTION: An apparatus for measuring density of specific material includes a processing reservoir(50) for performing an etching process with respect to a printed circuit board. A storing tank(70) is provided to supply chemical medicine into the processing reservoir(50). An electronic valve(40) is provided to intermittently supply chemical medicine from the storing tank(70) into the processing reservoir(50). An electric quantity detecting sensor(60) is immersed in the processing reservoir(50). A driving circuit is provided to drive a bridge circuit and the electronic valve(40). A computer(10) controls an opening/closing of the electronic valve(40) and checks density of specific material contained in the processing reservoir(50). The result is displayed in a monitor(20).
申请公布号 KR20030069728(A) 申请公布日期 2003.08.27
申请号 KR20020009668 申请日期 2002.02.22
申请人 LEE, KYUNG MOG;SHIN SUNG CHEMICAL CO., LTD. 发明人 LEE, KYUNG MOG
分类号 G01N27/22;(IPC1-7):G01N27/22 主分类号 G01N27/22
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