发明名称 ELECTRON DEVICE, SYSTEM, AND METHOD FOR JUDGING DEGREE OF VACUUM
摘要 PROBLEM TO BE SOLVED: To provide a means for judging the degree of vacuum in element units and to provide an electron device having the means, in the electron device that is sealed in a pressure-reduced atmosphere in element units. SOLUTION: The electron device is provided with an optical system 10, a board 30 having a plurality of infrared sensor elements 20 that are sealed by a cap body for each element, a Peltier element 50, a signal-processing circuit 60, an element-driving circuit 70, a temperature detection/Peltier element-driving circuit 80, and a shade 90 for inspection. The temperature of each bolometer is measured after a fixed time has elapsed by self heat generation of the bolometer in the infrared sensor element 20 for judging the degree of vacuum in each cap body. Since a temperature-retaining state in the cap body differs depending on the degree of vacuum, the degree of vacuum in each cap body can be judged by comparing a measurement temperature with a set value. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003240740(A) 申请公布日期 2003.08.27
申请号 JP20020039763 申请日期 2002.02.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KOBUCHI HIROTO
分类号 G01L21/00;G01N25/18;H01L27/14;(IPC1-7):G01N25/18 主分类号 G01L21/00
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