发明名称 Semiconductor device
摘要 A semiconductor device includes an active layer of a first conductive type. A base layer of a second conductive type is selectively formed on a surface region of said active layer. A source layer of the first conductive type is selectively formed on a surface region of the base layer. An anode layer of the second conductive type is selectively formed on a surface region of the active layer, the anode layer being spaced from the base layer. A drain layer of the first conductive type is formed on a surface region between the base layer and the anode layer. A resistive layer of the first conductive type is formed on a surface region between the base layer and the drain layer. And, a gate electrode is formed above a region of the base layer between the source layer and the active layer, a gate insulating film being disposed between the base layer and the gate electrode. A source electrode is formed on the surface of the base layer and the source layer, while a drain electrode is formed on the surface of the drain layer and the anode layer.
申请公布号 US6605844(B2) 申请公布日期 2003.08.12
申请号 US20010949611 申请日期 2001.09.12
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NAKAMURA KAZUTOSHI;KAWAGUCHI YUSUKE;NAKAGAWA AKIO
分类号 H01L29/78;H01L21/8234;H01L23/62;H01L27/02;H01L27/088;H01L29/739;H01L29/76;H01L29/786;(IPC1-7):H01L23/62 主分类号 H01L29/78
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