发明名称 Method for reduction of contaminants in amorphous-silicon film
摘要 A method of conditioning a chemical vapor deposition chamber prior to a deposition step on a substrate. The method includes passing a deposition gas mixture into the chamber under reaction conditions so as to deposit a layer of amorphous silicon on the interior surfaces in the chamber. Thereafter, a device comprising an amorphous silicon film is manufactured in a chemical vapor deposition chamber.
申请公布号 US2003143410(A1) 申请公布日期 2003.07.31
申请号 US20030359955 申请日期 2003.02.06
申请人 APPLIED MATERIALS, INC. 发明人 WON TAE KYUNG;SHANG QUANYUAN
分类号 C23C16/44;(IPC1-7):C23C16/00;B32B9/00 主分类号 C23C16/44
代理机构 代理人
主权项
地址