发明名称 MANUFACTURING METHOD OF NITRIDE SEMICONDUCTOR ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a nitride semiconductor element which is superior in the smoothness of division edge faces and in the yield. <P>SOLUTION: In the manufacturing method of a nitride semiconductor element, a semiconductor wafer (100) where a nitride semiconductor (102) is formed on a substrate (101) is divided into nitride semiconductors (110). Especially, the manufacturing method for the nitride semiconductor element has a process for forming an island-like nitride semiconductor, by exposing a substrate from the first main surface side of first and the second main surfaces of the semiconductor wafer (100), a process for forming a groove (103) in the substrate (101) in at least the first main surface side and/or the second main surface side, a process for forming along a brake line (104) in the groove (103) by laser irradiation and a process of separating the semiconductor wafer along the brake line (104). <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003218065(A) 申请公布日期 2003.07.31
申请号 JP20020329878 申请日期 2002.11.13
申请人 NICHIA CHEM IND LTD 发明人 SHONO HIROBUMI;TOYODA TATSUNORI
分类号 H01L21/301;H01L33/32;H01S5/02;H01S5/323;H01S5/343 主分类号 H01L21/301
代理机构 代理人
主权项
地址