发明名称 WAVEFORM CHECKING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a waveform checking device that can check simply and quickly whether a signal waveform is abnormal or not. SOLUTION: The waveform checking device is provided with a phase lock circuit 2 which generates a clock signal phase-locked with a signal obtained by bringing a probe 14 into contact with a terminal to be measured; an A/D converter 3 which samples the clock signal so as to be converted into a digital signal according to the clock signal; a memory 4 in which signal waveform data as the digital signal converted by the A/D converter 3 is stored; a processor 5 which processes the signal waveform data stored in the memory 4 and which detects an abnormality such as an overshoot, an undershoot, a waveform crack or the like in the signal waveform; an abnormality display means, with light emitting diodes 10, 11 or a buzzer, which displays the abnormality of the signal waveform detected by the processor 5; a liquid crystal panel 9 which can display the signal waveform; and a termination circuit 12 which is connected selectively by a switching circuit 13. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003202353(A) 申请公布日期 2003.07.18
申请号 JP20020001958 申请日期 2002.01.09
申请人 FUJITSU ACCESS LTD 发明人 ISHII TSUTOMU
分类号 G01R13/20;(IPC1-7):G01R13/20 主分类号 G01R13/20
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