发明名称 ABERRATION CORRECTING DEVICE IN CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an aberration correcting device of a charged particle beam device capable of stably and optimally correcting an aberration over a long time. SOLUTION: For correcting a chromatic aberration, this aberration correcting device has four-stage electrostatic quadrupoles 1, 2, 3, and 4, two-stage magnetic field type quadrupoles 5 and 6 for superimposing the magnetic potential distribution similar to the electric potential distribution of the central two-stage electrostatic quadrupoles 2 and 3, an objective lens 7, an operation display part 9 for changing accelerating voltage and an operating distance, a power source 10 for supplying voltage to the four-stage electrostatic quadrupoles 1 to 4, a power source 15 for exciting the two-stage magnetic field type quadrupoles 5 and 6, a power source 17 of the objective lens 7, and a control part 19 for controlling the power sources 10 and 15 on the basis of operation or the setting of the operation display part 9. When changing the accelerating voltage, excitation of the magnetic field type quadrupoles is maintained constant, and the chromatic aberration is corrected by adjusting combined magnification of the fourth electrostatic quadrupole 4 and the objective lens 7. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003203593(A) 申请公布日期 2003.07.18
申请号 JP20020300277 申请日期 2002.10.15
申请人 JEOL LTD 发明人 MATSUTANI MIYUKI;HONDA KAZUHIRO
分类号 H01J37/153;H01J37/145;(IPC1-7):H01J37/153 主分类号 H01J37/153
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