发明名称 |
Wien filter for use in a scanning electron microscope or the like |
摘要 |
A charged particle filter such as a Wien filter in which components used as the pole pieces and electrodes are precisely and reliably secured to a supporting structure through which they extend and to which they are brazed. Electrical insulating gaps in the magnetic circuit are located very remotely from the pole faces of the pole pieces so as to minimize any adverse effect of the gaps on the produced magnetic field.
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申请公布号 |
US6593578(B1) |
申请公布日期 |
2003.07.15 |
申请号 |
US20010010321 |
申请日期 |
2001.11.08 |
申请人 |
SCHLUMBERGER TECHNOLOGIES, INC. |
发明人 |
DUVAL PAUL J.;RUBIN ALLAN I.;ROSENBERG IRA;VAYNER VLADIMIR;SULLIVAN NEAL T. |
分类号 |
H01J37/256;H01J37/05;H01J37/244;H01J37/28;(IPC1-7):H01F7/00 |
主分类号 |
H01J37/256 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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