发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to be capable of exactly controlling overlay of a mask and simplifying processes by forming a nitride spacer before forming wells. CONSTITUTION: An oxide pattern(12a) and the first nitride pattern(14a) are sequentially formed on a semiconductor substrate(10). A nitride spacer(18a) is formed at both sidewalls of the patterns. After forming a BSG(Boron Silicate Glass) layer on the exposed substrate, a P-well is then formed in the substrate(10). Then, an N-well is formed in the substrate.
申请公布号 KR20030059462(A) 申请公布日期 2003.07.10
申请号 KR20010088325 申请日期 2001.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, CHUN SU;SHIN, SEONG HUN
分类号 H01L21/8238;(IPC1-7):H01L21/823 主分类号 H01L21/8238
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