发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to be capable of exactly controlling overlay of a mask and simplifying processes by forming a nitride spacer before forming wells. CONSTITUTION: An oxide pattern(12a) and the first nitride pattern(14a) are sequentially formed on a semiconductor substrate(10). A nitride spacer(18a) is formed at both sidewalls of the patterns. After forming a BSG(Boron Silicate Glass) layer on the exposed substrate, a P-well is then formed in the substrate(10). Then, an N-well is formed in the substrate.
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申请公布号 |
KR20030059462(A) |
申请公布日期 |
2003.07.10 |
申请号 |
KR20010088325 |
申请日期 |
2001.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KANG, CHUN SU;SHIN, SEONG HUN |
分类号 |
H01L21/8238;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/8238 |
代理机构 |
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主权项 |
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地址 |
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