发明名称 Method of manufacturing semiconductor device
摘要 According to the present invention, of the resist film applied to the entire surface of the silicon substrate, the part on the electrode pattern is removed and an opening shaped like a dish in which the diameter of the upper part is larger than that of the lower part is formed, wherein the diameter of the lower part is smaller than the outer diameter of the electrode pattern. The electrode pattern exposed at the bottom of the opening is removed by the etching process. Next, the silicon substrate is tilted and a laser beam is irradiated toward the silicon substrate exposed at the bottom of the opening with water running over the surface of the resist film in air, and a hole is formed.
申请公布号 US2003129814(A1) 申请公布日期 2003.07.10
申请号 US20020329515 申请日期 2002.12.27
申请人 FUJITSU LIMITED 发明人 MIZUKOSHI MASATAKA
分类号 H01L29/41;B23K26/14;B23K26/38;H01L21/302;H01L21/3205;H01L21/768;H01L23/52;H01L25/065;H01L25/07;H01L25/18;(IPC1-7):H01L21/20 主分类号 H01L29/41
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