Testing fixture

摘要

A deskew fixture has a multilayer circuit board from which pairs of mirrored signal launch contact extend from both sides of the circuit board. One pair of contacts is coupled to electrical ground and the other pair is connected via equal length, electromagnetically coupled strip lines to a signal source. Probe holders are mounted on the circuit boards to support measurement probes with the probing contacts of the measurement probes coupled to the signal launch contacts. Additional pairs of signal launch contacts may be provided with one pair receiving a positive signal from the signal source and another pair receiving a negative signal via equal length, electromagnetically coupled strip lines from the signal source for deskewing differential measurement probes. <IMAGE>