发明名称 |
RADIATION EXAMINATION APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a radiation examination apparatus in which the radiation examination of an examinee can be performed by using X-rays andγ-rays. SOLUTION: An imaging device 2 of the radiation examination apparatus 1 is provided with radiation detectors 4A and 4B disposed around a hole 33 into which a bed 16 is inserted. The radiation detector 4A has a detection part composed of square GaAs having a side length of 5 mm and a thickness of 2 mm. The radiation detector 4B has a detection part composed of a 5 mm cube of CdTe. The radiation detector 4A detects X-rays emitted from an X-ray source 9 and the detected X-rays are transmitted through the examinee 34 but does not detectγ-rays emitted from the examinee 34. The radiation detector 4B detects the X-rays andγ-rays. An X-ray signal processor 20 processes an X-ray imaging signal from the radiation detector 4A and outputs intensity information thereof. A signal identification device 21 processes aγ-ray imaging signal from the radiation detector 4B and outputs a pulse signal. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003190135(A) |
申请公布日期 |
2003.07.08 |
申请号 |
JP20010393044 |
申请日期 |
2001.12.26 |
申请人 |
HITACHI LTD |
发明人 |
UENO YUICHIRO;AMAMIYA KENSUKE;KOJIMA SHINICHI;OKAZAKI TAKASHI;UMEGAKI KIKUO;KITAGUCHI HIROSHI |
分类号 |
G01T1/161;A61B6/03;G01T1/164;G01T1/24;(IPC1-7):A61B6/03 |
主分类号 |
G01T1/161 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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