发明名称 RADIATION EXAMINATION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a radiation examination apparatus in which the radiation examination of an examinee can be performed by using X-rays andγ-rays. SOLUTION: An imaging device 2 of the radiation examination apparatus 1 is provided with radiation detectors 4A and 4B disposed around a hole 33 into which a bed 16 is inserted. The radiation detector 4A has a detection part composed of square GaAs having a side length of 5 mm and a thickness of 2 mm. The radiation detector 4B has a detection part composed of a 5 mm cube of CdTe. The radiation detector 4A detects X-rays emitted from an X-ray source 9 and the detected X-rays are transmitted through the examinee 34 but does not detectγ-rays emitted from the examinee 34. The radiation detector 4B detects the X-rays andγ-rays. An X-ray signal processor 20 processes an X-ray imaging signal from the radiation detector 4A and outputs intensity information thereof. A signal identification device 21 processes aγ-ray imaging signal from the radiation detector 4B and outputs a pulse signal. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003190135(A) 申请公布日期 2003.07.08
申请号 JP20010393044 申请日期 2001.12.26
申请人 HITACHI LTD 发明人 UENO YUICHIRO;AMAMIYA KENSUKE;KOJIMA SHINICHI;OKAZAKI TAKASHI;UMEGAKI KIKUO;KITAGUCHI HIROSHI
分类号 G01T1/161;A61B6/03;G01T1/164;G01T1/24;(IPC1-7):A61B6/03 主分类号 G01T1/161
代理机构 代理人
主权项
地址
您可能感兴趣的专利