发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE USING GROOVE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device using a groove is provided to control easily an effective channel length and improve a reverse short channel effect by increasing a process margin of an LDD(Lightly Doped Drain) region. CONSTITUTION: A shallow trench(104) is formed within an active region of a semiconductor substrate(100). A gate insulating layer(106) and a gate electrode(108) are formed on the semiconductor substrate within the trench. The first spacer(110) is formed on a sidewall of the gate electrode in order to cover the shallow trench. An LDD region(112) is formed near to a surface of the semiconductor substrate. The second spacer(114) is formed at a sidewall of the first spacer. A source/drain junction region(116) is formed within the semiconductor substrate.
|
申请公布号 |
KR20030058437(A) |
申请公布日期 |
2003.07.07 |
申请号 |
KR20010088891 |
申请日期 |
2001.12.31 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
CHO, YONG SU |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|