发明名称 METHOD FOR FORMING FIELD OXIDE LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a field oxide layer of a semiconductor device is provided to be capable of restraining bird's beak. CONSTITUTION: A pad oxide layer(12), a polysilicon layer(13) and the first nitride layer(14) are sequentially formed on a silicon substrate(11). A groove is formed to define a field oxide forming region by selectively etching the first nitride layer and the polysilicon layer. The second nitride layer(15) is formed on the resultant structure and the second nitride layer located at the bottom of the groove is selectively removed. A field oxide layer(16) is then formed by performing oxidation processing.
申请公布号 KR100391081(B1) 申请公布日期 2003.06.30
申请号 KR19960049505 申请日期 1996.10.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, GYU JIN;JIN, BYEONG JU;BAE, SEONG YONG
分类号 H01L21/30;(IPC1-7):H01L21/30 主分类号 H01L21/30
代理机构 代理人
主权项
地址